Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe Conference Proceedings uri icon

Overview

Published in

  • Microscopy and Microanalysis

Time

Date/time value

  • 2014

Identity

Digital Object Identifier (DOI)

  • 10.1017/S143192761400213X

Additional Document Info

Parent Title

  • Microscopy and Microanalysis

Volume

  • 20

Issue

  • 3

Publisher

  • Cambridge University Press