Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope Conference Proceedings uri icon

Overview

Authors

  • Authorship

    • WANG P
    • SHIMOJO M
    • KIRKLAND AI
    • NELLIST PD
    • D'ALFONSO A
    • MORGAN AJ
    • PROF Les J. Allen
    • HASHIMOTO A
    • TAKEGUCHI M
    • MITSUISHI K

Published in

  • Microscopy and Microanalysis

Time

Date/time value

  • 2014

Identity

Digital Object Identifier (DOI)

  • 10.1017/S1431927614003602

Additional Document Info

Parent Title

  • Microscopy and Microanalysis

Volume

  • 20

Issue

  • 3

Publisher

  • Cambridge University Press