Thin film characterization by atomic force microscopy at ultrasonic frequencies Journal Articles uri icon

Overview

Published in

  • Applied Physics Letters

Time

Date/time value

  • 2000

Identity

Digital Object Identifier (DOI)

  • 10.1063/1.126222

Additional Document Info

Parent Title

  • APPLIED PHYSICS LETTERS

Volume

  • 76

Issue

  • 14

Publisher

  • American Institute of Physics