Direct imaging of end-of-range compaction in ion beam irradiated silica waveguides by atomic force microscopy Journal Articles uri icon

Overview

Published in

  • Journal of Applied Physics

Time

Date/time value

  • 2000

Identity

Digital Object Identifier (DOI)

  • 10.1063/1.373558

Additional Document Info

Parent Title

  • JOURNAL OF APPLIED PHYSICS

Volume

  • 87

Issue

  • 12

Number

  • PII S0021-8979(00)01811-9

Publisher

  • American Institute of Physics