Damage in III-V compounds during focused ion beam milling Journal Articles Refereed uri icon

Overview

Published in

  • Microscopy and Microanalysis

Time

Date/time value

  • 2005

Identity

Digital Object Identifier (DOI)

  • 10.1017/S1431927605050294

Additional Document Info

Parent Title

  • Microscopy and Microanalysis

Volume

  • 11

Issue

  • 5

Publisher

  • Cambridge University Press