Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam Journal Articles uri icon

Overview

Published in

  • Journal of Materials Science Letters

Time

Date/time value

  • 2001

Identity

Digital Object Identifier (DOI)

  • 10.1023/A:1010950201525

Additional Document Info

Parent Title

  • Journal of Materials Science Letters

Volume

  • 20

Issue

  • 13

Publisher

  • Kluwer Academic Publishers