Spectroscopy and high-resolution microscopy of single nanocrystals by a focused ion beam registration method Journal Articles Refereed uri icon

Overview

Authors

Published in

  • Angewandte Chemie - International Edition

Time

Date/time value

  • 2007

Identity

Digital Object Identifier (DOI)

  • 10.1002/anie.200700033

Additional Document Info

Parent Title

  • ANGEWANDTE CHEMIE-INTERNATIONAL EDITION

Volume

  • 46

Issue

  • 19

Publisher

  • Wiley-VCH