Accurate determination of the thickness or mass per unit area of thin foils and single-crystal wafers for x-ray attenuation measurements Journal Articles Refereed uri icon

Overview

Published in

  • Review of Scientific Instruments

Time

Date/time value

  • 2004

Identity

Digital Object Identifier (DOI)

  • 10.1063/1.1781383

Additional Document Info

Parent Title

  • Review of Scientific Instruments

Volume

  • 75

Issue

  • 9

Publisher

  • American Institute of Physics