Ion-channeling and Raman scattering study of damage accumulation in silicon Journal Articles Refereed uri icon

Overview

Published in

  • Journal of Applied Physics

Time

Date/time value

  • 2004

Identity

Digital Object Identifier (DOI)

  • 10.1063/1.1636814

Additional Document Info

Parent Title

  • Journal of Applied Physics

Volume

  • 95

Issue

  • 3

Publisher

  • American Institute of Physics