Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images Journal Articles Refereed uri icon

Overview

Authors

  • Authorship

Published in

  • Ultramicroscopy

Time

Date/time value

  • 2013

Identity

Digital Object Identifier (DOI)

  • 10.1016/j.ultramic.2013.07.002

Additional Document Info

Parent Title

  • Ultramicroscopy

Volume

  • 133

Publisher

  • Elsevier Science