Meeting the Design Challenges of nano-CMOS Electronics Design Automation and Test in Europe Workshop on Impact of Process Variability on Design and Test Full Written Papers Refereed uri icon

Overview

Authors

  • Authorship

    • ASENOV A
    • TYRRELL A
    • MURRAY A
    • PICKLES S
    • BERRY D
    • PROF Richard Sinnott
    • MILLAR C
    • ROY S
    • CUMMING D
    • DRYSDALE T
    • FURBER S
    • EDWARDS D
    • ZWOLINSKI M

Time

Date/time value

  • 2008

Additional Document Info

Parent Title

  • EGEE User Conference
  • EGEE User Conference. Proceedings

Publisher

  • EGEE