Damage Layers In Diamond After Focused Ion Beam Milling Full Written Papers Unrefereed uri icon

Overview

Time

Date/time value

  • 2010

Identity

International Standard Book Number (ISBN) 13

  • 978-85-63273-06-2

Additional Document Info

Parent Title

  • 17th International Microscopy Congress
  • Proceedings

Publisher

  • The Brazilian Society for Microscopy and Microanalysis