Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy Other Refereed Contribution to Refereed Journals uri icon

Overview

Authors

  • Authorship

    • NELLIST PD
    • D'ALFONSO A
    • PROF Les J. Allen
    • FINDLAY SD
    • WANG P
    • BEHAN G
    • KIRKLAND AI
    • HASHIMOTO A
    • SHIMOJO M
    • MITSUISHI K
    • TAKEGUCHI M
    • COSGRIFF EC

Published in

  • Microscopy and Microanalysis

Time

Date/time value

  • 2010

Additional Document Info

Parent Title

  • Microscopy and Microanalysis

Volume

  • 16

Issue

  • Supp 2

Publisher

  • Cambridge University Press