Deep level transient spectroscopy study for the development of ion-implanted silicon field-effect transistors for spin-dependent transport Journal Articles Refereed uri icon

Overview

Published in

  • Thin Solid Films

Time

Date/time value

  • 2010

Identity

Digital Object Identifier (DOI)

  • 10.1016/j.tsf.2009.09.152

Additional Document Info

Parent Title

  • Thin Solid Films

Volume

  • 518

Publisher

  • Elsevier Science