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DR ANDREW ALVES



Contact Details

Organization: Physics
Position: RESEARCH FELLOW IN ATOMIC LEVEL FABRICATION
Email:
Work: 834 48123
Fax: 8347 4783
Room: 210
Level: 02
Building: Physics Building
Campus: Parkville

Research Expertise and International Linkages

Research Expertise

Research Interest Key Words Country of Expertise
single atoms implanted into silicon physics conductor disorder defects Australia
single atoms implanted into silicon physics conductor disorder defects Australia

Qualifications, Honours, Fellowships and Other Awards

Qualifications

Title Institution Date Awarded Abbreviation
Doctor of Philosophy Royal Melbourne Institute of Technology 16-Apr-2008

Other Awards

Award Type Awarding Body Comments Date Awarded
Other (Award) Institute of Materials Engineering Australasia Borland Forum Award 09-Oct-2007

Government Research Classifications

Research Fields, Courses and Discipline Classifications

Socio-Economic Objective Classifications

Publications

Publications produced at the University of Melbourne and reported in the Annual Publications Collection and 'Research Report' since 2001. The Themis Publications module, released in November 2006, allows additional publications from previous institutions and publications from past years to be entered.

Publications in 2008

Journal Articles

  • Scanning Transmission Ion Microscopy of Nanoscale Apertures
    Year: 2008
    Journal: Korean Physical Society. Journal
    Volume: 53
    Issue: 6
    Page numbers: 3704-3708
    Author(s):
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Conference Publications/Papers

  • The refractive index of ion implanted diamond


    Year: 2008
    Event name: 18th National AIP Congress 2008
    Conference Publication: Australian Institute of Physics 18th National Congress incorproating the 27th Plasma Science Conference
    Page numbers: 175-178
    Publisher: Australian Institute of Physics(Melbourne)
    Author(s):
    Editor(s):

Publications in 2007

Journal Articles

  • Characterization of ion tracks in PMMA for single ion lithography


    Year: 2007
    Journal: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
    Volume: 260
    Page numbers: 431-436
    Author(s):
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  • Ion beam lithography using a nano-aperture
    Year: 2007
    Journal: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
    Volume: 260
    Page numbers: 426-430
    Author(s):
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Conference Publications/Papers

  • Detection and placement fo single ions in the KeV and MeV regimes: MeV ion-aperture scattering
    Year: 2007
    Event name: 15th Australian Conference on Nuclear and Complementary Techniques of Analysis & 9th Vacuum Society of Australia Congress
    Conference Publication: 15th Australian Conference on Nuclear and Complementary Techniques of Analysis & 9th Vacuum Society of Australia Congress Proceedings
    Page numbers: 127-132
    Publisher: Australian Institute of Nuclear Science and Engineering(Lucas Hieghts)
    Author(s):
    Editor(s):

Publications in 2005

Journal Articles

  • Macrochannelling: characterisation of nano-structures by ion beam analysis
    Year: 2005
    Journal: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
    Volume: 231
    Page numbers: 130-135
    Author(s):
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Conference Publications/Papers

  • Ion beam lithography with single ions
    Year: 2005
    Event name: Micro- and nanotechnology: materials, processes, packaging, and systems II
    Conference Publication: Proceedings of SPIE
    Volume: 5650
    Page numbers: 381-390
    Publisher: SPIE - The International Society for Optical Engineering(Washington)
    Author(s):
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